SN74CB3T3257
- Output voltage translation tracks VCC
- Supports mixed-mode signal operation on all data I/O ports
- 5V input down to 3.3V output level shift with 3.3V VCC
- 5V/3.3V input down to 2.5V output level shift with 2.5V VCC
- 5V-tolerant I/Os with device powered up or powered down
- Bidirectional data flow with near-zero propagation delay
- Low ON-state resistance (ron) characteristics (ron = 5Ω typ)
- Low input/output capacitance minimizes loading (Cio(OFF) = 5pF typ)
- Data and control inputs provide undershoot clamp diodes
- Low power consumption (ICC = 20µA max)
- VCC operating range from 2.3V to 3.6V
- Data I/Os support 0V to 5V signaling levels (0.8V, 1.2V, 1.5V, 1.8V, 2.5V, 3.3V, 5V)
- Control inputs can be driven by TTL or 5V/3.3V CMOS outputs
- Ioff supports partial-power-down mode operation
- Latch-up performance exceeds 250mA per JESD 17
- ESD performance tested per JESD 22
- 2000V human-body model (A114-B, Class II)
- 1000V charged-device model (C101)
The SN74CB3T3257 is a high-speed TTL-compatible FET multiplexer/demultiplexer with low ON-state resistance (ron), allowing for minimal propagation delay. The device fully supports mixed-mode signal operation on all data I/O ports by providing voltage translation that tracks VCC. The SN74CB3T3257 supports systems using 5V TTL, 3.3V LVTTL, and 2.5V CMOS switching standards, as well as user-defined switching levels.
This device is fully specified for partial-power-down applications using Ioff. The Ioff feature verifies that damaging current does not backflow through the device when the device is powered down. The device has isolation during power off.
技术文档
设计和开发
如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。
LEADED-ADAPTER1 — 表面贴装转 DIP 接头适配器,用于快速测试 TI 的 5、8、10、16 和 24 引脚引线式封装。
EVM-LEADED1 电路板可用于对 TI 的常见引线式封装进行快速测试和电路板试验。 该电路板具有足够的空间,可将 TI 的 D、DBQ、DCT、DCU、DDF、DGS、DGV 和 PW 表面贴装封装转换为 100mil DIP 接头。
封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
TSSOP (PW) | 16 | Ultra Librarian |
TVSOP (DGV) | 16 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点
推荐产品可能包含与 TI 此产品相关的参数、评估模块或参考设计。