Home Logic & voltage translation Buffers, drivers & transceiver Noninverting buffers & drivers
Home
Logic & voltage translation
Buffers, drivers & transceiver
Noninverting buffers & drivers
NEW

SN54SC1G125-SEP

ACTIVE

Radiation-tolerant single channel buffer with triple-state outputs

Order now
Data sheet

SN54SC1G125-SEP

ACTIVE
Data sheet Order now

Product details

Rating Space Operating temperature range (°C) to
Rating Space Operating temperature range (°C) to
SOT-23 (DBV) 5 8.12 mm² 2.9 x 2.8
  • VID V62/26602
  • Radiation - total ionizing dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - single-event effects (SEE):
    • Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single event transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range from 1.2V to 5.5V

  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 100mA per JESD 78
  • Space enhanced plastic:
    • Supports Defense and Aerospace Applications
    • Controlled baseline
    • Au bond-wire and NiPdAu lead finish
    • Meets NASA ASTM E595 out gassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
  • VID V62/26602
  • Radiation - total ionizing dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - single-event effects (SEE):
    • Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single event transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range from 1.2V to 5.5V

  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 100mA per JESD 78
  • Space enhanced plastic:
    • Supports Defense and Aerospace Applications
    • Controlled baseline
    • Au bond-wire and NiPdAu lead finish
    • Meets NASA ASTM E595 out gassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability

The SN54SC1G125-SEP is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input pin is at a logic high level. When (OE) is at a logic low level, true data is passed from the A input to the Y output.

The SN54SC1G125-SEP is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input pin is at a logic high level. When (OE) is at a logic low level, true data is passed from the A input to the Y output.
filter Find other Noninverting buffers & drivers
Download View video with transcript Video

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 3
Top documentation Type Title Format options Date
* Data sheet SN54SC1G125-SEP Radiation Tolerant, Single Bus Buffer Gate With 3-State Output datasheet (Rev. A) PDF | HTML 05 May 2026
* Radiation & reliability report SN54SC1G125-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 29 Apr 2026
* Radiation & reliability report SN54SC1G125-SEP Production Flow and Reliability Report PDF | HTML 01 Apr 2026

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

5-8-LOGIC-EVM — Generic logic evaluation module for 5-pin to 8-pin DCK, DCT, DCU, DRL and DBV packages

Flexible EVM designed to support any device that has a DCK, DCT, DCU, DRL, or DBV package in a 5 to 8 pin count.
User guide: PDF
Not available on TI.com
Package Pins CAD symbols, footprints & 3D models
SOT-23 (DBV) 5 Ultra Librarian
TI's Standard Terms and Conditions for Evaluation Items apply.

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Support & training

TI E2E™ forums with technical support from TI engineers

View all forum topics

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos