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SN54SC1G125-SEP

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Radiation-tolerant single channel buffer with triple-state outputs

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Data sheet

SN54SC1G125-SEP

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Data sheet Order now

Product details

Rating Space Operating temperature range (°C) to
Rating Space Operating temperature range (°C) to
SOT-23 (DBV) 5 8.12 mm² 2.9 x 2.8
  • VID TBD-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50 krad(Si)
    • TID performance assurance up to 30 krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50 MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50 MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 100mA per JESD 78
  • Space enhanced plastic:
    • Supports Defense and Aerospace Applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
  • VID TBD-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50 krad(Si)
    • TID performance assurance up to 30 krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50 MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50 MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 100mA per JESD 78
  • Space enhanced plastic:
    • Supports Defense and Aerospace Applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability

The SN54SC1G125-SEP is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input pin is at a logic high level. When (OE) is at a logic low level, true data is passed from the A input to the Y output.

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The SN54SC1G125-SEP is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input pin is at a logic high level. When (OE) is at a logic low level, true data is passed from the A input to the Y output.

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* Data sheet SN54SC1G125-SEP Radiation Tolerant, Single Bus Buffer Gate with 3-State Output datasheet PDF | HTML 15 Jul 2025

Design & development

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Evaluation board

5-8-LOGIC-EVM — Generic logic evaluation module for 5-pin to 8-pin DCK, DCT, DCU, DRL and DBV packages

Flexible EVM designed to support any device that has a DCK, DCT, DCU, DRL, or DBV package in a 5 to 8 pin count.
User guide: PDF
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SOT-23 (DBV) 5 Ultra Librarian
TI's Standard Terms and Conditions for Evaluation Items apply.

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