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LM5066H

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5.5V to 90V advanced hot-swap controller with I/V/P monitoring and PMBus™ interface

Product details

FET External Vabsmax_cont (V) 100 Vin (max) (V) 90 Vin (min) (V) 5.5 Features Adjustable OVLO, Adjustable current limit, Adjustable soft start, Current monitoring, Fault output, Overvoltage protection, PMBus, Power good signal, Short circuit protection, adjustable UVLO Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry, Latch-off Overvoltage response Cut-off Rating Catalog Soft start Adjustable Quiescent current (Iq) (typ) (A) 0.00436 Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125
FET External Vabsmax_cont (V) 100 Vin (max) (V) 90 Vin (min) (V) 5.5 Features Adjustable OVLO, Adjustable current limit, Adjustable soft start, Current monitoring, Fault output, Overvoltage protection, PMBus, Power good signal, Short circuit protection, adjustable UVLO Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry, Latch-off Overvoltage response Cut-off Rating Catalog Soft start Adjustable Quiescent current (Iq) (typ) (A) 0.00436 Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125
HTSSOP (PWP) 28 62.08 mm² 9.7 x 6.4
  • 5.5V to 90V operation
    • 100V Continuous absolute max
    • Withstand up to -5V at output
  • Adjustable ILIM thresholds from 10mV to 50mV
  • Programmable FET SOA protection
  • Programmable overcurrent blanking with digital timer
  • Strong gate pull down (1.5A) for fast turn OFF
  • Robust short circuit protection
    • Fast trip response (360ns)
    • Immune to supply line transients
  • LM5066H2 with advanced features
    • Dual gate drive for high power applications
    • SYNC pin for parallel controller operation
    • Soft start capacitor disconnect
  • Failed FET detection
  • Programable UV, OV, tFAULT thresholds
  • External FET temperature sensing
  • Failed FET detection
  • I2C / SMBus interface
  • PMBus® interface for telemetry, control, configuration and debug
    • On chip EEPROM nonvolatile memory for configuration
    • Precision VIN, VOUT, IIN, PIN, VAUX monitoring V (<±1%); I (<±1%); P (<±1.75%)
    • Power cycle with a single command
    • Blackbox fault recording of multiple events with relative time stamp stored in internal EEPROM
  • 12-bit ADC with 250kHz sampling rate
  • Supports energy monitoring via Read_EIN command
  • External FET temperature sensing
  • –40°C < TJ < 125°C operation
  • 5.5V to 90V operation
    • 100V Continuous absolute max
    • Withstand up to -5V at output
  • Adjustable ILIM thresholds from 10mV to 50mV
  • Programmable FET SOA protection
  • Programmable overcurrent blanking with digital timer
  • Strong gate pull down (1.5A) for fast turn OFF
  • Robust short circuit protection
    • Fast trip response (360ns)
    • Immune to supply line transients
  • LM5066H2 with advanced features
    • Dual gate drive for high power applications
    • SYNC pin for parallel controller operation
    • Soft start capacitor disconnect
  • Failed FET detection
  • Programable UV, OV, tFAULT thresholds
  • External FET temperature sensing
  • Failed FET detection
  • I2C / SMBus interface
  • PMBus® interface for telemetry, control, configuration and debug
    • On chip EEPROM nonvolatile memory for configuration
    • Precision VIN, VOUT, IIN, PIN, VAUX monitoring V (<±1%); I (<±1%); P (<±1.75%)
    • Power cycle with a single command
    • Blackbox fault recording of multiple events with relative time stamp stored in internal EEPROM
  • 12-bit ADC with 250kHz sampling rate
  • Supports energy monitoring via Read_EIN command
  • External FET temperature sensing
  • –40°C < TJ < 125°C operation

The LM5066Hx provides robust protection and precision monitoring for 12V, 24V and 48V systems with programmable UV, OV, ILIM, and fast short circuit protection for customized input power applications. Programmable power limit threshold along with adjustable fault timer (tFAULT) limits maximum power dissipation and ensures FET SOA protection under all conditions including startup and fault events. Two level over current blanking with digital timers allows higher load transients to pass, enabling lower current limit settings and reducing requirements for strong SOA MOSFETs.

An integrated PMBus™interface enables remote monitoring, control, and configuration of the system in real time. Key parameters can be accessed remotely for telemetry, and various thresholds can be configured through PMBus or stored in internal non volatile memory. The fast, accurate analog load current monitor supports predictive maintenance and dynamic power management including Intel PSYS and PROCHOT functionality to optimize server performance. A blackbox fault recording feature helps in debugging field failures.

The LM5066H2 features dual gate drive architecture which enables use of a single strong SOA FET to handle power stress during startup and fault conditions, combined with multiple small low RDS(ON) FETs for normal load current operation, reducing the total solution size.

The LM5066Hx provides robust protection and precision monitoring for 12V, 24V and 48V systems with programmable UV, OV, ILIM, and fast short circuit protection for customized input power applications. Programmable power limit threshold along with adjustable fault timer (tFAULT) limits maximum power dissipation and ensures FET SOA protection under all conditions including startup and fault events. Two level over current blanking with digital timers allows higher load transients to pass, enabling lower current limit settings and reducing requirements for strong SOA MOSFETs.

An integrated PMBus™interface enables remote monitoring, control, and configuration of the system in real time. Key parameters can be accessed remotely for telemetry, and various thresholds can be configured through PMBus or stored in internal non volatile memory. The fast, accurate analog load current monitor supports predictive maintenance and dynamic power management including Intel PSYS and PROCHOT functionality to optimize server performance. A blackbox fault recording feature helps in debugging field failures.

The LM5066H2 features dual gate drive architecture which enables use of a single strong SOA FET to handle power stress during startup and fault conditions, combined with multiple small low RDS(ON) FETs for normal load current operation, reducing the total solution size.

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* Data sheet LM5066Hx 5.5V to 90V, Advanced Hotswap Controller With I/V/P Monitoring and PMBus Interface datasheet PDF | HTML 10 Oct 2025

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