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SN74LVC1G74

ACTIVE

Single Positive-Edge-Triggered D-Type Flip-Flop With Clear and Preset

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Data sheet

SN74LVC1G74

ACTIVE
Data sheet Order now

Product details

Number of channels 1 Technology family LVC Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 200 IOL (max) (mA) 32 IOH (max) (mA) -32 Supply current (max) (µA) 10 Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 125 Rating Catalog
Number of channels 1 Technology family LVC Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 200 IOL (max) (mA) 32 IOH (max) (mA) -32 Supply current (max) (µA) 10 Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 125 Rating Catalog
VSSOP (DCU) 8 6.2 mm² (2 mm × 3.1 mm) SSOP (DCT) 8 11.8 mm² (2.95 mm × 4 mm) X2SON (DQE) 8 1.4 mm² (1.4 mm × 1 mm) UQFN (RSE) 8 2.25 mm² (1.5 mm × 1.5 mm)
  • Available in the Texas Instruments NanoFree™ package
  • Supports 5-V VCC operation
  • Inputs accept voltages to 5.5-V
  • Supports down translation to VCC
  • Maximum tpd of 5.9-ns at 3.3-V
  • Low power consumption, 10-µA maximum ICC
  • ±24-mA output drive at 3.3-V
  • Typical VOLP (output ground bounce) < 0.8-V at VCC = 3.3-V, TA = 25°C
  • Typical VOHV (output VOH undershoot) > 2-V at VCC = 3.3 V, TA = 25°C
  • Ioff supports live insertion, partial-power-down mode, and back-drive protection
  • Latch-up performance exceeds 100 mA per JESD 78, class II
  • ESD protection exceeds JESD 22
    • 2000-V human-body model
    • 200-V machine model
    • 1000-V charged-device model
  • Available in the Texas Instruments NanoFree™ package
  • Supports 5-V VCC operation
  • Inputs accept voltages to 5.5-V
  • Supports down translation to VCC
  • Maximum tpd of 5.9-ns at 3.3-V
  • Low power consumption, 10-µA maximum ICC
  • ±24-mA output drive at 3.3-V
  • Typical VOLP (output ground bounce) < 0.8-V at VCC = 3.3-V, TA = 25°C
  • Typical VOHV (output VOH undershoot) > 2-V at VCC = 3.3 V, TA = 25°C
  • Ioff supports live insertion, partial-power-down mode, and back-drive protection
  • Latch-up performance exceeds 100 mA per JESD 78, class II
  • ESD protection exceeds JESD 22
    • 2000-V human-body model
    • 200-V machine model
    • 1000-V charged-device model

This single positive-edge-triggered D-type flip-flop is designed for 1.65-V to 5.5-V VCC operation.

NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

A low level at the preset ( PRE) or clear ( CLR) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

This single positive-edge-triggered D-type flip-flop is designed for 1.65-V to 5.5-V VCC operation.

NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

A low level at the preset ( PRE) or clear ( CLR) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
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Technical documentation

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Top documentation Type Title Format options Date
* Data sheet SN74LVC1G74 Single Positive-Edge-Triggered D-Type Flip-Flop with Clear and Preset datasheet (Rev. G) PDF | HTML Sep 14, 2021
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML Dec 15, 2022
Application brief Simplifying Solid-State Relay Designs With Logic PDF | HTML Jan 8, 2021
White paper Solving CMOS Transition Rate Issues Using Schmitt Trigger Solution (Rev. A) May 1, 2017

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SCEM591.ZIP (52 KB) - IBIS model
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