Product details

Technology family CD4000 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 6.8 IOH (max) (mA) -6.8 Input type Standard CMOS Output type Push-Pull Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 8 Rating Catalog Operating temperature range (°C) -55 to 125
Technology family CD4000 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 6.8 IOH (max) (mA) -6.8 Input type Standard CMOS Output type Push-Pull Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 8 Rating Catalog Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm) TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm) PDIP (N) 14 181.42 mm² (19.3 mm × 9.4 mm) SOP (NS) 14 79.56 mm² (10.2 mm × 7.8 mm)
  • Medium-Speed Operation - tPLH, tPHL = 60 ns (typ.) at VDD = 10 V
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range: 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"

CD4073B Triple 3-Input AND Gate
CD4081B Quad 2-Input AND Gate
CD4082B Dual 4-Input AND Gate
Data sheet acquired from Harris Semiconductor

  • Medium-Speed Operation - tPLH, tPHL = 60 ns (typ.) at VDD = 10 V
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range: 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Standardized, symmetrical output characteristics
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"

CD4073B Triple 3-Input AND Gate
CD4081B Quad 2-Input AND Gate
CD4082B Dual 4-Input AND Gate
Data sheet acquired from Harris Semiconductor

CD4073B, CD4081B and CD4082B AND gates, provide the system designer with direct implementation of the AND function and supplement the existing family of CMOS gates.

The CD4073B, CD4081B, and CD4082B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4073B, CD4081B and CD4082B AND gates, provide the system designer with direct implementation of the AND function and supplement the existing family of CMOS gates.

The CD4073B, CD4081B, and CD4082B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

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Technical documentation

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Top documentation Type Title Format options Date
* Data sheet CD4073B, CD4081B, CD4082B TYPES datasheet (Rev. C) Aug 21, 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics Dec 3, 2001

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

14-24-LOGIC-EVM — Logic product generic evaluation module for 14-pin to 24-pin D, DB, DGV, DW, DYY, NS and PW packages

The 14-24-LOGIC-EVM evaluation module (EVM) is designed to support any logic device that is in a 14-pin to 24-pin D, DW, DB, NS, PW, DYY or DGV package,

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Simulation model

CD4081B Behavioral SPICE Model (Rev. A)

SCHM010A.ZIP (7 KB) - PSpice model
Supported products & hardware
Reference design

TIDA-01051 — Reference Design Optimizing FPGA Utilization and Data Throughput for Automatic Test Equipment

The TIDA-01051 reference design is used to demonstrate optimized channel density, integration, power consumption, clock distribution and signal chain performance of very high channel count data acquisition (DAQ) systems such as those used in automatic test equipment (ATE). Using serializers, such (...)
Supported products & hardware
Package Pins CAD symbols, footprints & 3D models
SOIC (D) 14 Ultra Librarian
TSSOP (PW) 14 Ultra Librarian
PDIP (N) 14 Ultra Librarian
SOP (NS) 14 Ultra Librarian

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