- Controlled baseline:
- One assembly
- One test site
- One fabrication site
- Extended temperature performance: –55°C to +125°C
- Enhanced diminishing manufacturing sources (DMS) support
- Enhanced product-change notification
- Qualification pedigree(1)
- Stable with no output capacitor or any value or type of capacitor
- Input voltage range: 1.7V to 5.5V
- Ultra-low dropout voltage: 75mV typical
- Excellent load transient response (With or without optional output capacitor)
- New NMOS topology delivers low reverse leakage current
- Low noise: 30µVRMS typical (10Hz to 100kHz)
- Initial accuracy: 0.5%
- 1% Overall accuracy over line, load, and temperature
- Less than 1µA max IQ in shutdown mode
- Thermal shutdown and specified min/max current limit protection
- Available in multiple output voltage versions:
- Fixed outputs: 1.2V to 3.3V
- Adjustable output: 1.2V to 5.5V
- Custom outputs available
(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.