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SN55LVRA4-SEP

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Quad channel high-speed differential receiver

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Data sheet

SN55LVRA4-SEP

ACTIVE
Data sheet Order now

Product details

Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating Space Operating temperature range (°C) -55 to 125
Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating Space Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² 9.9 x 6
  • VID V62/25606-01XE
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 50MeV-cm2 /mg
    • Single event transient (SET) characterization report available
  • 400Mbps signaling rate
  • Operates with a single 3.3V supply
  • –4V to 5V extended common-mode input voltage range
  • Differential input thresholds < ±50mV with 50mV of hysteresis over entire common-mode input voltage range
  • Complies with TIA/EIA-644 (LVDS)
  • Active fail-safe assures a high-level output with no input and input remains high-impedance on power down
  • Bus-pin ESD protection exceeds 15kV HBM
  • TTL control inputs are 5V tolerant
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification
  • VID V62/25606-01XE
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 50MeV-cm2 /mg
    • Single event transient (SET) characterization report available
  • 400Mbps signaling rate
  • Operates with a single 3.3V supply
  • –4V to 5V extended common-mode input voltage range
  • Differential input thresholds < ±50mV with 50mV of hysteresis over entire common-mode input voltage range
  • Complies with TIA/EIA-644 (LVDS)
  • Active fail-safe assures a high-level output with no input and input remains high-impedance on power down
  • Bus-pin ESD protection exceeds 15kV HBM
  • TTL control inputs are 5V tolerant
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold wire, NiPdAu lead finish
    • One assembly and test site, one fabrication site
    • Extended product life cycle
    • Military (–55°C to 125°C) temperature range
    • Product traceability
    • Meets NASA ASTM E595 outgassing specification

The SN55LVRA4-SEP offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5V PECL signal as well as an overall increased ground-noise tolerance.

The SN55LVRA4-SEP include a failsafe circuit that provides a high-level output within 60ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVRA4-SEP is characterized for operation from –55°C to 125°C.

The SN55LVRA4-SEP offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5V PECL signal as well as an overall increased ground-noise tolerance.

The SN55LVRA4-SEP include a failsafe circuit that provides a high-level output within 60ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100Ω. The transmission media can be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN55LVRA4-SEP is characterized for operation from –55°C to 125°C.
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Top documentation Type Title Format options Date
* Data sheet SN55LVRA4-SEP Radiation Tolerant Quad Channel High-Speed Differential Receiver datasheet (Rev. B) PDF | HTML 19 Feb 2026
* VID SN55LVRA4-SEP VID SN55LVRA4-SEP VID V62-25606 20 Feb 2026
* Radiation & reliability report SN55LVRA4-SEP Total Ionizing Dose (TID) Report 10 Dec 2025
* Radiation & reliability report SN55LVRA4-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 08 Dec 2025
* Radiation & reliability report SN55LVRA4-SEP Production Flow and Reliability Report PDF | HTML 12 Nov 2025
Selection guide TI Space Products (Rev. L) 27 Mar 2026

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