ISOS510-SEP
- Radiation Performance
- Total Ionizing Dose (TID) Characterized (ELDRS-Free) up to 50krad(Si)
- TID RLAT up to 30krad(Si)
- Single-Event Latch-up (SEL) Immune to LET up to 43MeV-cm2/mg at 125℃
- Single-event functional interrupt (SEFI) and single-event transient (SET) characterized LET up to 43MeV-cm2/mg
- Space Enhanced Plastic (Space EP)
- Meets NASA ASTM E595 Outgassing Spec
- Military Temp Range (-55℃ to 125℃)
- 1-channel diode input
- Current transfer ratio (CTR) at IF = 5mA, VCE = 5V: 100% to 155%
- High collector-emitter voltage: VCE (max) = 30V
- Robust SiO2 isolation barrier
- Isolation rating: 3750VRMS
- Working voltage: 500VRMS, 707VPK
- Surge capability: up to 10kV
- Response time: 3µs (typical) at VCE = 10V, IC = 2mA, RL = 100Ω
- Small 4-pin package (DFG)
- Safety-related certifications:
- UL 1577 recognition
- DIN EN IEC 60747-17 (VDE 0884-17) conformity per VDE
The ISOS510 radiation-tolerant device is a single-channel, current-driven, analog isolator with transistor output. The device offers significant reliability and performance advantages compared to other current-driven analog isolators, including high bandwidth, low turn-off delay, low power consumption, wider temperature ranges, flat current transfer ratio (CTR), and tight process controls resulting in small part-to-part skew. These performance advantages stay stable across radiation, temperature, and lifetime.
ISOS510 is offered in small a SOIC-4 package with 2.54mm pin pitch, supporting a 3.75kVRMS isolation rating . The high performance and reliability of ISOS510 enables these devices to be used in aerospace & defense applications such as feedback loops in isolated DC/DC modules, satellite propulsion power processing units, spacecraft battery management systems, and more.
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | ISOS510-SEP Radiation Tolerant , Current-Driven Analog Isolator With Transistor Output 数据表 | PDF | HTML | 2025年 8月 1日 | ||
应用手册 | 所选封装材料的热学和电学性质 | 2008年 10月 16日 |
设计和开发
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封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
SOIC (DFG) | 4 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点
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