The UCC27735-Q1 evaluation module (EVM) is developed so the UCC27735-Q1 driver performance can be evaluated and compared to data sheet parameters, or externally connected to power devices with provisions for source and sink gate-resistance flexibility. The UCC27735Q1EVM evaluation board uses surface-mount test points allowing connection to LI, HI, VDD, and HB inputs. A variety of other test points are available for probing the UCC27735-Q1. The input bias is configured so the VHB-VHS high-side bias can be sourced from VCC, or an external additional bias can be added to provide VHBVHS directly. The high- and low-side driver output returns are separated on HS and GND respectively to allow evaluation of the UCC27735-Q1 HS negative voltage capabilities.
Features
- EVM for the low-voltage features of the UCC27735-Q1 gate driver
- 10V to 21V VCC power supply range
- TTL-compatible inputs
- PCB layout optimized for bias supply bypassing cap, gate-drive resistance selection
- Capacitive load, external gate drive resistor and diode for gate drive network evaluation
- Allows quick verification of most of the data sheet parameters
- Test points allow probing all the key pins of the UCC27735-Q1