Our integrated circuits and reference designs help create high-precision automotive interface communications hardware in loop (HIL) tester for accurate testing of all automotive subsystems during manufacturing and service of the vehicle.
New generation automotive interface and communications HIL tester designs require:
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| Type | Title | Date | ||
|---|---|---|---|---|
| Application note | Clocking Optimization for RF Sampling Analog-to-Digital Converters (Rev. A) | PDF | HTML | Apr 7, 2021 | |
| White paper | Voltage-reference impact on total harmonic distortion | Aug 1, 2016 | ||
| Application note | 66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B) | Jun 20, 2016 | ||
| White paper | Minimum Power Specifications for High-Performance ADC Power-Supply Designs | Mar 31, 2016 | ||
| Analog design Journal | Power-supply design for high-speed ADCs (Rev. A) | May 18, 2015 | ||
| Analog design Journal | JESD204B multi-device synchronization: Breaking down the requirements | Apr 28, 2015 | ||
| Application note | Principles of Data Acquisition and Conversion (Rev. A) | PDF | HTML | Apr 16, 2015 | |
| White paper | Direct RF conversion: From vision to reality | Feb 11, 2015 | ||
| Application note | Signal Chain Noise Figure Analysis | Oct 29, 2014 | ||
| Analog design Journal | Impact of sampling-clock spurs on ADC performance | Jul 14, 2009 |
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