This document contains information for the TPS7B770x-Q1 (HTSSOP package) to aid in a functional safety system design. Information provided are:

• Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

The TPS7B770x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

This section provides functional safety failure in time (FIT) rates for the TPS7B770x-Q1 based on two different industry-wide used reliability standards:

• Table 2-3 and Table 2-3 provide FIT rates based on IEC TR 62380 / ISO 26262 part 11
• Table 2-4 and Table 2-4 provide FIT rates based on the Siemens Norm SN 29500-2