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  • TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report

    • SBOK095 December   2024 TRF0208-SP

       

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  • TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report
  1.   1
  2.    TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C References
  17. IMPORTANT NOTICE
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Radiation Report

TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report

Abstract

The effect of heavy-ion irradiation on the single-event effects performance of the radiation-hardness-assured (RHA) TRF0208-SP is summarized in this report. Heavy-ions with an LETEFF up to 81.6 MeV-cm2/mg were used to irradiate two production devices in multiple runs. Flux up to 105 ions/cm2-s and fluences up to 107 ions/cm2 at temperatures of 25°C (SET) and 125°C (SEL), were used for the characterization. Results demonstrate that the TRF0208-SP is SEL-free up to LETEFF = 81.6 MeV-cm2/mg and 125°C, and the cross section for the SET is discussed.

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