This report presents the effect of neutron displacement damage (NDD) on the Texas Instruments OPA4H199-SP. The OPA4H199-SP showed a strong degree of hardness to neutron irradiation up to fluence level 1 × 10¹³ n/cm².

The neutron irradiation test is a destructive test. Test procedure follows MIL-STD-883 method 1017 as guidance. The purpose of this test is to determine the device susceptibility to non-ionizing energy loss (NIEL) degradation. Objectives of the test are to detect and measure the degradation of critical device parameters as a function of neutron fluence and to determine if these parameters are within specified limits after exposure to a specified level of neutron fluence.

The OPA4H199-SP was subjected to a one-time characterization to determine the effects of Neutron Displacement Damage (NDD) to the device parameters. A sample size of twelve units was exposed to radiation testing per MIL-STD-883 (Method 1017 for Neutron Irradiation). The samples were dosed to exposure levels of 1 × 10¹² n/cm², 5 × 10¹² n/cm², and 1 × 10¹³ n/cm², with four samples evaluated per exposure level. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for the device.