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  • TRF0206-SP (5962R2122001VXC) Neutron Displacement Damage Characterization

    • SBOK071 December   2022 TRF0206-SP

       

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  • TRF0206-SP (5962R2122001VXC) Neutron Displacement Damage Characterization
  1.    TRF0206-SP (5962R2122001VXC) Neutron Displacement Damage Characterization
  2.   Trademarks
  3. 1Overview
  4. 2Test Procedures
  5. 3Facility
  6. 4Results
  7.   A Test Results
  8. IMPORTANT NOTICE
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RADIATION & RELIABILITY REPORTS

TRF0206-SP (5962R2122001VXC) Neutron Displacement Damage Characterization

1 TRF0206-SP (5962R2122001VXC) Neutron Displacement Damage Characterization

This report presents the effect of neutron displacement damage (NDD) on the TRF0206-SP device. The results show that all devices were fully functional and within production test limits after having been irradiated up to 1 × 1013 n/cm2 (1-MeV equivalent). A sample size of fifteen units was exposed to radiation testing per (MIL-STD-883, Method 1017 for Neutron Irradiation) and an additional unirradiated sample device was used for correlation. All devices used in the experiment were from lot date code 2227B and assembly lot 2007400. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for 5962R2122001VXC.

Trademarks

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1 Overview

The TRF0206-SP is a very high-performance, radiation hardened, differential amplifier optimized for radio frequency (RF), intermediate frequency (IF), or high-speed applications. The device is ideal for ac-coupled applications that may require a single-ended-to-differential (S2D) conversion when driving an analog-to-digital converter (ADC). The TRF0206-SP generates very low levels of second- and third-order distortion upto very high frequencies. General device information and testing conditions are listed in Table 1-1.

Table 1-1 Overview Information
TI Part NumberTRF0206-SP
SMD Number5962-21220
Device Function6.5 GHz Bandwidth, High-linearity ADC Driver Amplifier
Die NameRTRF0206A0
Technology

RF SiGe

A/T Lot Number / Date Code2007400 / 2227B
Unbiased Quantity Tested

9

Exposure FacilityVPT Rad
Neutron Fluence (1-MeV Equivalent)1.0 × 1012, 5.0 × 1012, 1.0 × 1013 n/cm2
Irradiation Temperature25°C
TI may provide technical, applications or design advice, quality characterization, and reliability data or service providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.

2 Test Procedures

The TRF0206-SP was electrically pre-tested using the production automated test equipment program. General test procedures were IAW MIL-STD-883, Method 1017 for Neutron Irradiation of TRF0206-SP as modified in Table 2-1.

Table 2-1 Neutron Irradiation Conditions
Group Sample Qty Neutron Fluence (n/cm2) Bias
A

3

1.0 × 1012 Unbiased
B

3

5.0 × 1012 Unbiased
C

3

1.0 × 1013 Unbiased
Figure 2-1 TRF0206-SP Device

 

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