• Menu
  • Product
  • Email
  • PDF
  • Order now
  • TPS7H60X5-SEP Single-Event Effects (SEE) Report

    • SNOK010 November   2024 TPS7H6005-SEP , TPS7H6015-SEP , TPS7H6025-SEP

       

  • CONTENTS
  • SEARCH
  • TPS7H60X5-SEP Single-Event Effects (SEE) Report
  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15. IMPORTANT NOTICE
search No matches found.
  • Full reading width
    • Full reading width
    • Comfortable reading width
    • Expanded reading width
  • Card for each section
  • Card with all content

 

Radiation Report

TPS7H60X5-SEP Single-Event Effects (SEE) Report

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TPS7H6005-SEP, TPS7H6015-SEP, and TPS7H6025-SEP. Heavy-ions with LETEFF of 48 MeV × cm2/mg was used to irradiate twelve production devices. Flux of approximately 105 ions/cm2×s and fluence of approximately 107 ions/cm2 per run were used for the characterization. The results demonstrate the performance of the TPS7H60x5-SEP under SEL and SEB and SEGR conditions at T = 125°C and T = 25°C, respectively. SET transients performance for output pulse width excursions ≥ |20%| from the nominal width and positive and negative edge transients on HO and LO are presented and discussed.

Trademarks

LabVIEW™ is a trademark of National Instruments, Inc.

HP-Z4® is a registered trademark of HP Inc.

All trademarks are the property of their respective owners.

 

Texas Instruments

© Copyright 1995-2025 Texas Instruments Incorporated. All rights reserved.
Submit documentation feedback | IMPORTANT NOTICE | Trademarks | Privacy policy | Cookie policy | Terms of use | Terms of sale