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  • TPS1HB08-Q1Functional Safety FIT Rate, FMD and Pin FMA

    • SFFS003 January   2021 TPS1HB08-Q1

       

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  • TPS1HB08-Q1Functional Safety FIT Rate, FMD and Pin FMA
  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. IMPORTANT NOTICE
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FUNCTIONAL SAFETY FIT RATE, FMD AND PIN-FMA

TPS1HB08-Q1Functional Safety FIT Rate, FMD and Pin FMA

Trademarks

All trademarks are the property of their respective owners.

1 Overview

This document contains information for TPS1HB08-Q1 (HTSSOP package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-AFAA6D98-4A05-4BC9-B9CE-396320C05128-low.gif Figure 1-1 Functional Block Diagram

TPS1HB08-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

2 Functional Safety Failure In Time (FIT) Rates

This section provides Functional Safety Failure In Time (FIT) rates for TPS1HB08-Q1 based on industry-wide used reliability standard:

  • Table 2-1 provides FIT rates based on IEC TR 62380 / ISO 26262 part 11
Table 2-1 Component Failure Rates per IEC TR 62380 / ISO 26262 Part 11
FIT IEC TR 62380 / ISO 26262FIT (Failures Per 109 Hours)
Total Component FIT Rate22
Die FIT Rate12
Package FIT Rate

10

The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:

  • Mission Profile: Motor Control from Table 11
  • Power dissipation: 750 mW
  • Climate type: World-wide Table 8 IEC TR 62380
  • Package factor (lambda 3): Table 17b IEC TR 62380
  • Substrate Material: FR4
  • EOS FIT rate assumed: 0 FIT

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for TPS1HB08-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
VOUT open (HiZ)20%
VOUT stuck on (VBB) 10%
VOUT functional, not in specification voltage or timing45%
Diagnostics not in specification10%
Protect functions fails to trip10%
Pin to Pin short any two pins5%

 

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