The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the SN54SC8T541-SEP. SEE performance was verified at minimum (1.2V) and maximum (5.5V) operating conditions. Heavy-ions with an LET_EFF of 50MeV-cm²/ mg were used to irradiate three production devices with a fluence of 1 × 10⁷ ions / cm². The results demonstrate that the SN54SC8T541-SEP is SEL-free up to LET_EFF = 50MeV-cm² / mg as 125°C. SET performance at minimum and maximum operating voltages saw no excursions ≥ |1%| , as shown and discussed in this report.

The SN54SC8T541-SEP Single-Event Effects (SEE) radiation report covers the SEE performance of all devices listed below. The SN54SC8T541-SEP device covers all functional blocks and active die area of the other devices, which is why the device was selected for single-event effect testing for this group of devices.

• SN54SC8T541-SEP
• SN54SC8T240-SEP
• SN54SC8T244-SEP
• SN54SC8T9541-SEP