SBOK098 February 2025 SN54SC8T138-SEP , SN54SC8T139-SEP , SN54SC8T151-SEP , SN54SC8T157-SEP
The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the SN54SC8T138-SEP. SEE performance was verified at minimum (1.2V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 50MeV-cm2/ mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC8T138-SEP is SEL-free up to LETEFF = 50MeV-cm2 / mg as 125°C. SET performance at minimum and maximum operating voltages saw no excursions ≥ |1%| , as shown and discussed in this report.
The SN54SC8T138-SEP Single-Event Effects (SEE) radiation report covers the SEE performance of all devices listed below. The SN54SC8T138-SEP device covers all functional blocks and active die area of the other devices, which is why the device was selected for single-event effect testing for this group of devices.
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The SN54SC8T138-SEP is a radiation-tolerant, 3-line to 8-line decoder/demultiplexer with logic level shifter. The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example, 3.3V to 2.5V output).
For more information, see the SN54SC8T138-SEP product page.
| Description | Device Information |
|---|---|
| TI Part Number | SN54SC8T138-SEP |
| Orderable Part Number | SN54SC8T138MPWTSEP |
| VID Number | V62/25622 |
| Device Function | Radiation-tolerant, 1.2V to 5.5V, 3-line to 8-line Decoder/Demultiplexer With Logic Level Shifter |
| Technology | LBC9 |
| Exposure Facility | Facility for Rare Isotope Beams (FRIB) at Michigan State University – FRIB Single Event Effects (FSEE) Facility |
| Heavy Ion Fluence per Run | 1 × 107 ions / cm2 |
| Irradiation Temperature | 25°C (for SET testing) and 125°C (for SEL testing) |