This document contains information for INAx180-Q1 (SOT-23-5, VSSOP-8, and TSSOP-14 packages), INAx181-Q1 (SOT-23-6, VSSOP-10, TSSOP-20, and DCK packages) and INA185-Q1 DCK package to aid in a functional safety system design. In this report, INAx180-Q1, INAx181-Q1, and INA185-Q1 refer to the family of devices including:

• INA180-Q1
• INA2180-Q1
• INA4180-Q1
• INA181-Q1
• INA2181-Q1
• INA4181-Q1
• INA185-Q1

Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (Pin FMA)

INA180-Q1 Functional Block Diagram, Figure 1-2, Figure 1-3, Figure 1-4, Figure 1-5, and Figure 1-6 show the device functional block diagrams for reference.

INAx180-Q1, INAx181-Q1, and INA185-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.