This report covers the radiation characterization results of Texas Instrument's AFE7950-SP. The AFE7950-SP was studied for Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 120rad(Si)/s as a one-time characterization. The results show that all samples passed within the specified limits up to 100krad(Si).

To ensure TID performance in production, Radiation Lot Acceptance Testing (RLAT) is performed using five units from every wafer lot up to a dose level of 100 krad(Si). Additionally, the AFE7950-SP is Single Event Latch-Up (SEL) immune up to 70MeV-cm²/mg, which makes it suitable for Radiation Hardness Assured Space Applications in LEO, MEO, and GEO orbits.