This document contains information for ISO6731/ISO6731-Q1 and ISO6731F/ISO6731F-Q1 (16-DW package) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the functional block diagram of one channel of ISO6731/ISO6731-Q1 and ISO6731F/ISO6731F-Q1 for reference.

Figure 1-1 Functional Block Diagram

ISO6731/ISO6731-Q1 and ISO6731F/ISO6731F-Q1 were developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.