The SN54SC4T125-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2 / mg, which makes the device an option for low Earth orbit space applications.
The SN54SC4T125-SEP Total Ionizing Dose (TID) Report covers the TID performance of all seven devices listed below. The SN54SC4T125-SEP device covers all functional blocks and active die area of the other six devices, which is why the device was selected for total ionizing dose testing for this group of logic gate devices.
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The SN54SC4T125-SEP contains four independent buffers with 3-state outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.2-V, 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels. The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (For example, 1.2-V input to 1.8-V output or 1.8-V input to 3.3-V output.) Additionally, the 5-V tolerant input pins enable down translation (For example, 3.3-V to 2.5-V output). The SN54SC4T125-SEP is a pure CMOS device and as a result, was tested at a High Dose Rate (HDR) for TID testing.