SN54SC4T125-SEP Production Flow and Reliability Report

Abstract

This report presents the reliability and qualification results for the Texas Instruments SN54SC4T125-SEP, - a radiation-tolerant, quadruple buffer translator gate with 3-state output CMOS logic level shifter in Space Enhanced Plastic (SEP). The SN54SC4T125-SEP is manufactured with a controlled baseline that has the following:

An extended product life cycle
One assembly and test site
Product traceability

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1 Texas Instruments Enhanced Product Qualification and Reliability Report

TI qualification testing is a risk mitigation process that is engineered to assure device longevity in customer applications. Wafer fabrication process and package level reliability are evaluated in a variety of ways that may include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and assure continuity of supply to customers. TI Enhanced Products are qualified with industry standard test methodologies performed to the intent of Joint Electron Devices Engineering Council (JEDEC) standards and procedures. Texas Instruments Enhanced Products meet GEIA-STD-0002-1 Aerospace Qualified Electronic Components.