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  • OPA4H199-SP Total Ionizing Dose (TID) Radiation Report

    • SBOK093 December   2024 OPA4H199-SP

       

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  • OPA4H199-SP Total Ionizing Dose (TID) Radiation Report
  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Electrical Characteristics
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix A: Enhanced Low Dose Rate Sensitivity (ELDRS) Characterization Report
  9.   B Appendix B: HDR Results Report at 100krad(Si)
  10.   C Appendix C: LDR Results Report at 100krad(Si)
  11.   D Appendix D: HDR Results Report at 100krad(Si) with Absolute Maximum Rating Supply Voltage
  12. IMPORTANT NOTICE
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Radiation Report

OPA4H199-SP Total Ionizing Dose (TID) Radiation Report

Abstract

This report discusses the results of the TID testing for the Texas Instruments OPA4H199-SP. The OPA4H199-SP is a 40V rail-to-rail input and output (RRIO) 4.5MHz, low offset voltage, low noise operation amplifier with MUX-friendly inputs.

The study was done to determine TID effects under high dose rate (HDR) up to 100krad(Si) after 168h anneal at room temperature (resulting in an effective dose rate of 165mrad(Si)/s).

The results show that all samples passed within the specified limits up to 100krad(Si).

 
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