The OPA4H014-SEP was subjected to a one-time characterization to determine the effects of Neutron Displacement Damage (NDD) to the device parameters. A sample size of nine units was exposed to radiation testing per MIL-STD-883 (Method 1017 for Neutron Irradiation). The samples were dosed to exposure levels of 1 × 1012 n/cm2, 5 × 1012 n/cm2, and 1 × 1013 n/cm2, with three samples evaluated per exposure level. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for the device. Degradation of offset voltage, input bias current, input offset current, and open-loop gain specifications on some samples was observed and is discussed herein.