This report presents the reliability and qualification results for the ADC12DJ5200-SEP, a radiation-hardness-assured (RHA), 30krad, 12-bit, dual 5.2-GSPS or single 10.4-GSPS Analog-to-Digital Converter (ADC). The ADC12DJ5200-SEP is manufactured with a controlled baseline and has the following advantages compared to commercial-grade devices:
All trademarks are the property of their respective owners.
TI qualification testing is a risk mitigation process that is engineered to assure device longevity in customer applications. Wafer fabrication process and package level reliability are evaluated in a variety of ways that may include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and assure continuity of supply to customers. TIs Space Enhanced Products (SEP) are qualified with industry standard test methodologies performed to the intent of Joint Electron Devices Engineering Council (JEDEC) standards and procedures.