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  • ADC12DJ5200-SEP Production Flow and Reliability Report

    • SBAK023A February   2025  – March 2025 ADC12DJ5200-SEP

       

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  • ADC12DJ5200-SEP Production Flow and Reliability Report
  1.   1
  2.   ADC12DJ5200-SEP Production Flow and Reliability Report
  3.   Trademarks
  4. 1Texas Instruments Space-Enhanced Product Qualification and Reliability Report
  5. 2Space-Enhanced Product Production Flow
    1. 2.1 Device Introduction
    2. 2.2 ADC12DJ5200-SEP Space-Enhanced Product Production Flow
  6. 3Device Qualification
  7. 4Outgas Test Report
  8. IMPORTANT NOTICE
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Reliability Report

ADC12DJ5200-SEP Production Flow and Reliability Report

Abstract

This report presents the reliability and qualification results for the ADC12DJ5200-SEP, a radiation-hardness-assured (RHA), 30krad, 12-bit, dual 5.2-GSPS or single 10.4-GSPS Analog-to-Digital Converter (ADC). The ADC12DJ5200-SEP is manufactured with a controlled baseline and has the following advantages compared to commercial-grade devices:

  • An extended product life cycle
  • Controlled baseline: one fab, assembly and test site
  • Product traceability
  • Lot-acceptance testing

Trademarks

All trademarks are the property of their respective owners.

1 Texas Instruments Space-Enhanced Product Qualification and Reliability Report

TI qualification testing is a risk mitigation process that is engineered to assure device longevity in customer applications. Wafer fabrication process and package level reliability are evaluated in a variety of ways that may include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and assure continuity of supply to customers. TIs Space Enhanced Products (SEP) are qualified with industry standard test methodologies performed to the intent of Joint Electron Devices Engineering Council (JEDEC) standards and procedures.

 

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