The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the AFE7950-SP. Heavy-ions with LET_EFF (Effective Linear Energy Transfer) of up to 70 MeV·cm²/mg were used to irradiate the device. Tests were run across a range of flux and fluences for the characterization. Flux was between 10² and 10⁵ ions/(cm²·s) and fluence up to 10⁷ ions/cm² per run. The results demonstrated that the AFE7950-SP is single event latch-up free at a device junction temperature of 125°C. Single event upsets and functional interrupts are characterized at ambient room temperature, no external heat applied, up to 58 MeV·cm²/mg. See Section 7 for more details.